Ion-induced defects in semiconductors
- James W. Corbett
- James P. Karins
- et al.
- 1981
- Nuclear Instruments and Methods
Paper
Publications
1992 results for Impact Science
On the role of the primary beam and of scattered or sputtered particles in the faceting of cones on bombarded surfaces
- Orlando Auciello
- Roger Kelly
- 1981
- Nuclear Instruments and Methods
PaperA fragment-cofragment model of antibody incidence structures
- Andrew Wohlgemuth
- George Markowsky
- 1981
- Mathematical Biosciences
PaperOn the kinetic energies of sputtered excited particles. III. Recoil sputtering as a source of high-energy particles
- Steven Dzioba
- Roger Kelly
- 1981
- Nuclear Instruments and Methods
PaperDetection of true pathologic stage I lung cancer in a screening program and the effect on survival
- Myron R. Melamed
- Betty J. Flehinger
- et al.
- 1981
- Cancer
PaperLow energy ion bombardment during crystal growth and its effect on structure, composition and physical properties
- Eric Kay
- 1981
- Nuclear Instruments and Methods
PaperCarcinogenicity of methylated benzo(a)pyrene: Calculated ease of formation of the bay-region carbonium ion
- B.D. Silverman
- 1981
- Cancer Biochemistry Biophysics
PaperAn ellipsoidal mirror display analyzer system for electron energy and angular measurements
- D.E. Eastman
- J.J. Donelon
- et al.
- 1980
- Nuclear Instruments and Methods
PaperAtomic beam diffraction from solid surfaces
- K.H. Rieder
- T. Engel
- 1980
- Nuclear Instruments and Methods
PaperComparison of ion-excited Auger electron emission and secondary ion emission from silicon bombarded with noble gas ions
- K. Wittmaack
- 1980
- Nuclear Instruments and Methods
Paper