Thermal stress-induced and electromigration-induced void-open failures in Al and Al-Cu fine lines
- T. Kwok
- K.K. Chan
- et al.
- 1991
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Publications
24861 results for Exploratory Science
A declarative specification and semantics for visual languages
- Richard Helm
- Kim Marriott
- 1991
- JVLC
PaperSuccessive Refinement of Information
- Thomas M. Cover
- 1991
- IEEE Trans. Inf. Theory
PaperOxygen interaction with defects at the Si/SiO2 interface
- J.H. Stathis
- S. Rigo
- et al.
- 1991
- Solid State Communications
PaperStress and thermal expansion of boron-doped silicon membranes on silicon substrates
- B.S. Berry
- W.C. Pritchet
- 1991
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperA new preconditioning technique for solving large sparse linear systems
- M. Tismenetsky
- 1991
- Linear Algebra and Its Applications
Paper16-Term Error Model and Calibration Procedure for On-Wafer Network Analysis Measurements
- Marc Vanden Bossche
- 1991
- IEEE T-MTT
PaperExecution of automatically parallelized APL programs on RP3
- W.-W. Ching
- D. Ju
- 1991
- IBM J. Res. Dev
PaperOn Codes Satisfying Mth-Order Running Digital Sum Constraints
- Evangelos Eleftheriou
- Roy D. Cideciyan
- 1991
- IEEE Trans. Inf. Theory
PaperBallistic electron emission spectroscopy of noble metai-gap(110) interfaces
- R. Ludeke
- M. Prietsch
- 1991
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper