Surface analysis of realistic semiconductor microstructures
- Gottlieb S. Oehrlein
- Kevin K. Chan
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Publications
24861 results for Exploratory Science
Nanolithography at 350 KV in a TEM
- A.N. Broers
- A.E. Timbs
- et al.
- 1989
- Microelectronic Engineering
PaperPraseodymium 1-2-3: Intrinsic structure, oxygen concentration effects, and solid solutions with yttrium, calcium and zinc
- M.E. López-Morales
- A. Bezinge
- et al.
- 1989
- Physica C: Superconductivity and its applications
PaperInfrared measurement of a Tl2Ba2CaCu2O8-x film
- Z. Schlesinger
- R.T. Collins
- et al.
- 1989
- Physica C: Superconductivity and its applications
PaperConnectivity Properties of a Packet Radio Network Model
- Thomas K. Philips
- Shivendra S. Panwar
- et al.
- 1989
- IEEE Trans. Inf. Theory
PaperInterband transitions from the photoreflectance of GaSb/AlSb multiple quantum wells
- H. Shen
- Z. Hang
- et al.
- 1989
- Superlattices and Microstructures
PaperThe determination of structure in small supported metal particles by scanning transmission electron diffraction
- H. Poppa
- R.D. Moorhead
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperNeural Networks, Error-Correcting Codes, and Polynomials over the Binary n-Cube
- Jehoshua Bruck
- Mario Blaum
- 1989
- IEEE Trans. Inf. Theory
PaperLow-angle tilt grain boundaries in YBa2Cu3O7 superconductors
- M.F.C. Hisholm
- D.A. Smith
- 1989
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
PaperThe angular dependence of preferential sputtering and composition in aluminum-copper thin films
- P. Rudeck
- J.M.E. Harper
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper