An integrated methodology for accurate extraction of S/D series resistance components in nanoscale MOSFETs
- Seong-Dong Kim
- Shreesh Narasimha
- et al.
- 2005
- IEDM 2005
Conference paper
Publications
18 results at IEDM 2005
Selective epitaxial channel ground plane thin SOI CMOS devices
- Zhibin Ren
- M. Ieong
- et al.
- 2005
- IEDM 2005
Conference paperEnabling SOI-based assembly technology for three-dimensional (3D) integrated circuits (ICs)
- A. Topol
- D.C. La Tulipe
- et al.
- 2005
- IEDM 2005
Conference paperPerformance and limitations of 65 nm CMOS for integrated RF power applications
- Jörg Scholvin
- David R. Greenberg
- et al.
- 2005
- IEDM 2005
Conference paperCarbon nanotube interconnects: Implications for performance, power dissipation and thermal management
- Navin Srivastava
- Rajiv V. Joshi
- et al.
- 2005
- IEDM 2005
Conference paperDesign of high performance PFETs with strained Si channel and laser anneal
- Z. Luo
- Y.F. Chong
- et al.
- 2005
- IEDM 2005
Conference paperHigh performance 65 nm SOI technology with enhanced transistor strain and advanced-low-K BEOL
- W.-H. Lee
- A. Waite
- et al.
- 2005
- IEDM 2005
Conference paperFluctuation limits & scaling opportunities for CMOS SRAM cells
- Azeez Bhavnagarwala
- Stephen Kosonocky
- et al.
- 2005
- IEDM 2005
Conference paper