Interconnect Issues post 45nm
- S.M. Rossnagel
- Robert L. Wisnieff
- et al.
- 2005
- IEDM 2005
Conference paper
Publications
18 results at IEDM 2005
High performance CMOS bulk technology using direct silicon bond (DSB) mixed crystal orientation substrates
- Chun-Yung Sung
- Haizhou Yin
- et al.
- 2005
- IEDM 2005
Conference paperThe Micro to Nano Addressing Block (MNAB)
- K. Gopalakrishnan
- R.S. Shenoy
- et al.
- 2005
- IEDM 2005
Conference paperIntegration and optimization of embedded-SiGe, compressive and tensile stressed liner films, and stress memorization in advanced SOI CMOS technologies
- M. Horstmann
- A. Wei
- et al.
- 2005
- IEDM 2005
Conference paperStress memorization in high-performance FDSOI devices with ultra-thin silicon channels and 25nm gate lengths
- D. Singh
- J. Sleight
- et al.
- 2005
- IEDM 2005
Conference paperSOI 90-nm ring oscillator sub-ps model-hardware correlation and parasitic-aware optimization leading to 1.94-ps switching delay
- Jean-Olivier Plouchart
- Jonghae Kim
- et al.
- 2005
- IEDM 2005
Conference paperFrom DRAM to SRAM with a novel SiGe-based negative differential resistance (NDR) device
- Liang Yue
- Kailash Gopalakrishnan
- et al.
- 2005
- IEDM 2005
Conference paperAn integrated methodology for accurate extraction of S/D series resistance components in nanoscale MOSFETs
- Seong-Dong Kim
- Shreesh Narasimha
- et al.
- 2005
- IEDM 2005
Conference paperSelective epitaxial channel ground plane thin SOI CMOS devices
- Zhibin Ren
- M. Ieong
- et al.
- 2005
- IEDM 2005
Conference paperEnabling SOI-based assembly technology for three-dimensional (3D) integrated circuits (ICs)
- A. Topol
- D.C. La Tulipe
- et al.
- 2005
- IEDM 2005
Conference paper