Publications

15 results at IRPS 2015

Phase-change memory: Feasibility of reliable multilevel-cell storage and retention at elevated temperatures
- - Milos Stanisavljevic
  - A. Athmanathan
  - et al.
- 2015
- IRPS 2015
Impact of 3D copper TSV integration on 32SOI FEOL and BEOL reliability
- - Mukta Farooq
  - Giuseppe La Rosa
  - et al.
- 2015
- IRPS 2015
A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)
- - Ernest Y. Wu
  - James Stathis
  - et al.
- 2015
- IRPS 2015
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements
- - Franco Stellari
  - Keith A. Jenkins
  - et al.
- 2015
- IRPS 2015
A collective relaxation model for resistance drift in phase change memory cells
- - Abu Sebastian
  - Daniel Krebs
  - et al.
- 2015
- IRPS 2015