Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications
- C. Kothandaraman
- X. Chen
- et al.
- 2015
- IRPS 2015
Conference paper
Publications
15 results at IRPS 2015
Time-integrated photon emission as a function of temperature in 32 nm CMOS
- Andrea Bahgat Shehata
- Alan J. Weger
- et al.
- 2015
- IRPS 2015
Conference paperA critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)
- Ernest Y. Wu
- James Stathis
- et al.
- 2015
- IRPS 2015
Conference paperImpact of 3D copper TSV integration on 32SOI FEOL and BEOL reliability
- Mukta Farooq
- Giuseppe La Rosa
- et al.
- 2015
- IRPS 2015
Conference paperSOI FinFET soft error upset susceptibility and analysis
- Phil Oldiges
- Ken Rodbell
- et al.
- 2015
- IRPS 2015
Conference paper