A method for rapid screening of various low-k TDDB models
- F. Chen
- Carole Graas
- et al.
- 2015
- IRPS 2015
Conference paper
Publications
15 results at IRPS 2015
Analyzing path delays for accelerated testing of logic chips
- Emily Ray
- Barry P. Linder
- et al.
- 2015
- IRPS 2015
Conference paperLong-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology
- Pong-Fei Lu
- Keith A. Jenkins
- et al.
- 2015
- IRPS 2015
Conference paperSeparation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFET
- Miaomiao Wang
- Zuoguang Liu
- et al.
- 2015
- IRPS 2015
Conference paperA case study of electromigration reliability: From design point to system operations
- Baozhen Li
- Paul Muller
- et al.
- 2015
- IRPS 2015
Conference paper