Stepper self-metrology using automated techniques
- T.A. Brunner
- J.M. Lewis
- et al.
- 1990
- Microlithography 1990
Conference paper
Publications
26883 results for Science
Quantitative measures for surface texture description in semiconductor wafer inspection
- A.Ravishankar Rao
- Ramesh Jain
- 1990
- Microlithography 1990
Conference paperA high-performance switch with applications to frame relay networks
- A. Birman
- 1990
- IEEE INFOCOM 1990
Conference paperImproving ARQ protocol performance by multiple FIFO buffers
- I.S. Gopal
- Raphael Rom
- 1990
- IEEE INFOCOM 1990
Conference paperSub-30ps ECL circuits using high-fT Si and SiGe epitaxial base SEEW transistors
- J.N. Burghartz
- J.H. Comfort
- et al.
- 1990
- IEDM 1990
Conference paperRelaxometry of MRI contrast agents: Liposomes containing Gd(DTPA)2-
- S.H. Koenig
- Q.F. Ahkong
- et al.
- 1990
- Farmacevtski Vestnik
Conference paperDCT based video compression using arithmetic coding
- C.A. Gonzales
- K.L. Anderson
- et al.
- 1990
- Electronic Imaging: Advanced Devices and Systems 1990
Conference paperSiGe-base heterojunction bipolar transistors: Physics and design issues
- G.L. Patton
- J.M.C. Stork
- et al.
- 1990
- IEDM 1990
Conference paperMarkov-modulated flow model for the output queues of a packet switch
- J.S.-C. Chen
- R. Guerin
- et al.
- 1990
- IEEE INFOCOM 1990
Conference paperVLSI-oriented architectures for real-time image processing
- W.E. Blanz
- 1990
- Electronic Imaging: Advanced Devices and Systems 1990
Conference paper