A new planarization technique, using a combination of RIE and chemical mechanical polish (CMP)
- B. Davari
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- 1989
- IEDM 1989
Conference paper
Publications
26941 results for Science
Estimating system availability and reliability
- Ambuj Goyal
- 1989
- WSC 1989
Conference paperCharacteristics of CMOS devices fabricated using high quality thin PECVD gate oxide
- L.K. Wang
- D.S. Wen
- et al.
- 1989
- IEDM 1989
Conference paperAn economy for flow control in computer networks
- Donald F. Ferguson
- Christos Nikolaou
- et al.
- 1989
- IEEE INFOCOM 1989
Conference paperLaser transfer of organic adsorbates: a test case using coronene surface patterns transferred with micrometer resolution to IR Windows
- M. DeVries
- H.E. Hunziker
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paperAn integrated algorithm for probabilistic protocol verification and evaluation
- Dragomir D. Dimitrijevic
- Mon-Song Chen
- 1989
- IEEE INFOCOM 1989
Conference paperOn the scaling property of trench isolation capacitance for advanced high-performance ECL circuits
- C.T. Chuang
- P.F. Lu
- 1989
- IEDM 1989
Conference paperSpatially localized electronic structure in polyaniline by scanning tunneling spectroscopy
- Dawn A. Bonnell
- Marie Angelopoulos
- 1989
- Synthetic Metals
PaperScanning tunneling microscopy and first-principles theory of the Sn/GaAs(110) surface
- C.K. Shih
- Efthimios Kaxiras
- et al.
- 1989
- Physical Review B
PaperQuadratic temperature dependence of the in-plane resistivity in superconducting Nd1.85CuO4 - Evidence for Fermi-liquid normal state
- C.C. Tsuei
- A. Gupta
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- 1989
- Physica C: Superconductivity and its applications
Paper