Effects of biased cosputtering on resistivity and step coverage in tungsten silicide films
- K.W. Choi
- K.Y. Ahn
- 1985
- JVSTA
Paper
Publications
24861 results for Exploratory Science
Electronic structure of GaSbAlSb superlattices
- P. Voisin
- C. Delalande
- et al.
- 1985
- Superlattices and Microstructures
PaperA dynamic lattice dislocation grain boundary sliding mechanism
- Keith Reading
- David A. Smith
- 1985
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
PaperBackground and applications of electron beam test techniques
- Fritz J. Hohn
- 1985
- Microelectronic Engineering
PaperChemical reactions at Pt/oxide/Si and Ti/oxide/Si interfaces
- M. Liehr
- F.K. LeGoues
- et al.
- 1985
- JVSTA
PaperPARAMETER REDUCTION AND CONTEXT SELECTION FOR COMPRESSION OF GRAY-SCALE IMAGES.
- S.J.P. Todd
- Glen G. Langdon Jr.
- et al.
- 1985
- IBM J. Res. Dev
PaperSolving NP-hard problems in 'almost trees': Vertex cover
- Don Coppersmith
- Uzi Vishkin
- 1985
- Discrete Applied Mathematics
PaperNitrogen-associated paramagnetic defect centers in sputtered SiO2 films
- E.J. Friebele
- D.L. Griscom
- et al.
- 1985
- Journal of Non-Crystalline Solids
PaperA survey of Lanczos procedures for very large real 'symmetric' eigenvalue problems
- Jane Cullum
- Ralph A. Willoughby
- 1985
- J. Comput. Appl. Math.
PaperCharacterization of electron-beam deposited tungsten films on sapphire and silicon
- J.H. Souk
- J.F. O'Hanlon
- et al.
- 1985
- JVSTA
Paper