Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure
- A. Erbil
- G.S. Cargill Iii
- et al.
- 1988
- Physical Review B
Paper
Publications
26943 results for Science
The date refinement calculator for Z specifications
- Mark B. Josephs
- 1988
- Information Processing Letters
PaperMetallic CaSi2 epitaxial films on Si(111)
- J.F. Morar
- M. Wittmer
- 1988
- Physical Review B
PaperPreparation and properties of resistive films
- K.K. Shih
- A. Aviram
- et al.
- 1988
- Thin Solid Films
PaperSurface metallization of silicon by potassium adsorption on Si(001)-(2×1)
- S. Ciraci
- Inder P. Batra
- 1988
- Physical Review B
PaperStructural perfection of the Si(111)-(1×1) As surface
- M. Copel
- R.M. Tromp
- 1988
- Physical Review B
PaperEffects on vibrational and electronic properties of removing hydrogen atoms in hydrogenated amorphous silicon
- J.S. Nelson
- C.Y. Fong
- et al.
- 1988
- Physical Review B
PaperPhotoelectron scanning electron microscope (PSEM) for high speed noncontact testing
- P.G. May
- J.-M. Halbout
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Conference paperPicosecond photoemission sampling for contactless high speed integrated circuit diagnostics
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Conference paperCharacterization of logic devices with photoconductively generated picosecond pulses
- J.-M. Halbout
- P.G. May
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Conference paper