Comparative ESR study of three (BEDT-TTF): ReO4 salts: An organic superconductor, a peierls metal and a semiconductor
- K. Carneiro
- J.C. Scott
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- 1984
- Solid State Communications
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Publications
26944 results for Science
The Effect of film thickness on the electrical properties of LPCVD polysilicon films
- T.T. Sheng
- C.C. Shih
- et al.
- 1984
- JES
PaperMICROSTRUCTURE EVOLUTION DURING ELECTROLESS COPPER DEPOSITION.
- J. Kim
- Sheree H. Wen
- et al.
- 1984
- IBM J. Res. Dev
PaperBarrier Layers: Principles and applications in microelectronics
- Marc Wittmer
- 1984
- JVSTA
PaperCharacterization of plasma polymer films of phenylsilane by X-ray photoelectron spectroscopy
- P. Oelhafen
- J.A. Cutro
- et al.
- 1984
- Journal of Electron Spectroscopy and Related Phenomena
PaperProperties of interfaces in (Cdzn)S/culnse2heterojunctions
- J.E. Lewis
- P.S. Ho
- et al.
- 1984
- JVSTA
PaperHierarchical channel router
- Michael Burstein
- Richard Pelavin
- 1984
- Computer-Aided Design
PaperMechanical properties of In-based eutectic alloy solders used in Josephson packaging
- J.T.C. Yeh
- 1984
- Cryogenics
PaperHelium scattering from (1x1) H-Pt(111)
- F.J. Himpel
- Inder P. Batra
- 1984
- JVSTA
PaperRaman Spectroscopy of Silicide Formation at the Pt/Crystalline Si Interface
- J.C. Tsang
- G.W. Rubloff
- et al.
- 1984
- JVSTA
Paper