Dielectric Breakdown Properties of SiO2 Films Grown in Halogen and Hydrogen-Containing EnvironmentsC.M. Osburn1974JESPaper
Polarization Reduction in Thin Ferroelectrics with Semiconducting ElectrodesI.P. Batra1974FerroelectricsPaper
A Lattice Parameter Criterion for Miscibility Gaps in the III-V and II-VI Pseudobinary Solid SolutionsL.M. Foster1974JESPaper
Collision-broadened phonon line shape in the overdamped or hydrodynamic regimeB.D. Silverman1974Physical Review BPaper
Crystallization of sulfides from alkali polysulfide fluxesH.J. Scheel1974Journal of Crystal GrowthPaper
Electrolysis method of intercalation of layered transition metal dichalcogenidesG.V.Subba RaoJ.C. Tsang1974Materials Research BulletinPaper
Sodium-Induced Barrier-Height Lowering and Dielectric Breakdown on SiO2 Films on SiliconC.M. OsburnD.W. Ormond1974JESPaper
T.8 Observation of Population Inversion by Optical Adiabatic Fast PassageMichael M. T. Loy1974IEEE JQEPaper
Grain boundary self-diffusion in evaporated Au films at low temperaturesD. GuptaK.W. Asai1974Thin Solid FilmsPaper