Delamination from surface cracks in composite materials
- M.D. Thouless
- H.C. Cao
- et al.
- 1989
- Journal of Materials Science
Paper
Publications
3555 results for Materials Discovery
Structure of Cs on GaAs(110) as determined by scanning tunneling microscopy
- P.N. First
- R.A. Dragoset
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperStructure of the Si(111)/CaF2 interface
- R.M. Tromp
- M.C. Reuter
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperCompetitive reactions of fluorine and oxygen with W, WSi2, and Si surfaces in reactive ion etching using CF4/O2
- Gottlieb S. Oehrlein
- J. Lennart Lindsöm
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperTIN formed by ion beam nitriding of TiSi2
- S.E. Harnstrarn
- D. Moy
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperNucleation and growth in the reaction of titanium with germanium and some silicon-germanium alloys
- O. Thomas
- F.M. D'Heurle
- et al.
- 1989
- Applied Surface Science
PaperLarge bearing numbers and stationary reynolds roughness
- C. Greengard
- 1989
- Journal of Tribology
PaperA new experimental technique for studying mass transport in liquid metals
- I.Y. Khandros
- M. Ohring
- 1989
- Journal of Materials Science
PaperThe angular dependence of preferential sputtering and composition in aluminum-copper thin films
- P. Rudeck
- J.M.E. Harper
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperGate materials consideration for submicron CMOS
- C.-Y. Ting
- B. Davari
- 1989
- Applied Surface Science
Paper