AC Test Quality: Beyond Transition Fault Coverage
- Y. Aizenbud
- P. Chang
- et al.
- 1992
- IEEE ITC 1992
Conference paper
Publications
3608 results for Mathematical Sciences
Advances in Membrane Probe Technology
- J. Kister
- R.L. Franch
- 1992
- IEEE ITC 1992
Conference paperA small test generator for large designs
- Sandip Kundu
- Leendert M. Huisman
- et al.
- 1992
- IEEE ITC 1992
Conference paperBanded matrices with banded inverses
- Charles A. Micchelli
- 1992
- J. Comput. Appl. Math.
PaperTask dependence, veridicality, and pre-attentive vision: Taking advantage of perceptually-rich computer environments
- Bernice E. Rogowitz
- Daniel T. Ling
- et al.
- 1992
- IS&T/SPIE Electronic Imaging 1992
Conference paperLuminance-model-based DCT quantization for color image compression
- Albert J. Ahumada
- Heidi A. Peterson
- 1992
- IS&T/SPIE Electronic Imaging 1992
Conference paperIdentifying high level features of texture perception
- A. Ravishankar Rao
- Jerry Lohse
- 1992
- IS&T/SPIE Electronic Imaging 1992
Conference paperAn objective method for measuring VDU flicker
- Russell Chaplin
- 1992
- IS&T/SPIE Electronic Imaging 1992
Conference paperSome characteristics of a TDI scanner
- Gerald Goertzel
- Carlo J. Evangelisti
- 1992
- IS&T/SPIE Electronic Imaging 1992
Conference paperPerformance evaluation of a high-quality TDI-CCD color scanner
- Hon-Sum Wong
- Whan-Soo Kang
- et al.
- 1992
- IS&T/SPIE Electronic Imaging 1992
Conference paper