Surface analysis of realistic semiconductor microstructures
- Gottlieb S. Oehrlein
- Kevin K. Chan
- et al.
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Publications
3553 results for Materials Discovery
Roughness and porosity characterization of carbon and magnetic films through adsorption isotherm measurements
- C.L. Wang
- M.F. Toney
- 1989
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperX-ray powder diffraction analysis of the electron superconductor Nd2-xThxCuO4 system
- T.C. Huang
- P.W. Wang
- et al.
- 1989
- Materials Research Bulletin
PaperRaman spectroscopy of carbon overcoats for magnetic disks
- H. Seki
- 1989
- Surface and Coatings Technology
PaperMetallurgical topics in silicon device interconnections: Thin film stresses
- F.M. D’Heurle
- 1989
- International Materials Reviews
ReviewMagnetic and magneto‐optic thin films and multilayers in San Diego
- Ernesto Marinerom
- Takao Suzuki
- 1989
- Advanced Materials
Conference paperMolecular electronics—science and technology
- Ari Aviram
- 1989
- Advanced Materials
Conference paperElectrical resistivity and structural changes in amorphous Ge1-xAlx thin films under thermal annealing
- F. Catalina
- C.N. Afonso
- et al.
- 1988
- Thin Solid Films
PaperEffects of deposition conditions on the superconducting properties of r.f. and d.c. magnetron sputter-deposited YBa2Cu3O7-x films
- W.-Y. Lee
- J.R. Salem
- et al.
- 1988
- Thin Solid Films
PaperProof of the ionic character of the interaction of K with Si(100): A cluster model study
- Paul S. Bagus
- Inder P. Batra
- 1988
- Surface Science
Paper