Output Structure for Buried-Channel CCD
- Savvas G. Chamberlain
- 1984
- IEEE T-ED
Paper
Publications
465 results at IEEE T-ED
Nonuniform Displacement of MOSFET Channel Pinchoff
- Savvas G. Chamberlain
- Asim Husain
- et al.
- 1984
- IEEE T-ED
PaperGeneralized Scaling Theory and Its Application to a 1/4 micrometer MOSFET Design
- Robert H. Dennard
- Matthew R. Wordeman
- 1984
- IEEE T-ED
PaperElectromigration Lifetime Sudies of Submicrometer-Linewidth Al-Cu Conductors
- Subramanian S. Iyer
- Chung-YU Ting
- 1984
- IEEE T-ED
PaperA Study of Projected Optical Images for Typical IC Mask Patterns Illuminated by Partially Coherent Light
- Albert C. Liu
- Burn Jeng Lin
- 1983
- IEEE T-ED
PaperVA-8 Germanium MISFETs Exhibiting Low Interface State Density Using Ge3N4 Gate Insulator
- James J. Rosenberg
- 1983
- IEEE T-ED
PaperIIA-6 Sensitivity of Threshold Voltage and Sheet Carrier Concentration to Material and Electronic Parameters in a HEMT Device
- Sandip Tiwari
- 1983
- IEEE T-ED
PaperOn the Current-Voltage Characteristics of n+-p-p+ Diodes
- C.T. Chuang
- 1983
- IEEE T-ED
PaperTransient Electronic Transport in InP Under the Condition of High-Energy Electron Injection
- Kevin Brennan
- Karl Hess
- et al.
- 1983
- IEEE T-ED
PaperTunneling in Base-Emitter Junctions
- Johannes M. C. Stork
- Randall D. Isaac
- 1983
- IEEE T-ED
Paper