Schottky barrier, electronic states and microstructure at Ni silicide-silicon interfaces
- P.S. Ho
- M. Liehr
- et al.
- 1986
- Surface Science
Publications
3549 results for Materials Discovery
Inverse photoemission as a probe for unoccupied electronic states
- F.J. Himpsel
- D. Straub
- 1986
- Surface Science
Tunneling microscopy and spectroscopy of semiconductor surfaces and interfaces
- A. Baratoff
- G. Binnig
- et al.
- 1986
- Surface Science
Early stages in the formation of the oxide-InP(110) interface
- G. Hollinger
- G. Hughes
- et al.
- 1986
- Surface Science
The effects of microstructure on interface characterization
- R. Ludeke
- 1986
- Surface Science
Comments on round table discussion on future trends
- Paul S. Ho
- 1986
- Surface Science
Si(111) surface oxidation: O 1s core-level study using synchrotron radiation
- G. Hollinger
- J.F. Morar
- et al.
- 1986
- Surface Science
Analyses of Ne-diffraction data from transition-metal surfaces based on charge-density calculations
- M. Baumberger
- K.H. Rieder
- et al.
- 1986
- Surface Science
Oxide characterization and behavior at CuCu and CuCuOx interfaces
- H. Lefakis
- P.S. Ho
- 1986
- Thin Solid Films
Sputtering of multicomponent materials: The diffusion limit
- Antonino Oliva
- Roger Kelly
- et al.
- 1986
- Surface Science