Tunneling microscopy and spectroscopy of semiconductor surfaces and interfaces
- A. Baratoff
- G. Binnig
- et al.
- 1986
- Surface Science
Paper
Publications
3553 results for Materials Discovery
Analyses of Ne-diffraction data from transition-metal surfaces based on charge-density calculations
- M. Baumberger
- K.H. Rieder
- et al.
- 1986
- Surface Science
PaperOxide characterization and behavior at CuCu and CuCuOx interfaces
- H. Lefakis
- P.S. Ho
- 1986
- Thin Solid Films
PaperSputtering of multicomponent materials: The diffusion limit
- Antonino Oliva
- Roger Kelly
- et al.
- 1986
- Surface Science
PaperThe formation of disilicides from bilayers of Ni/Co and Co/Ni on silicon: Phase separation and solid solution
- T.G. Finstad
- D.D. Anfiteatro
- et al.
- 1986
- Thin Solid Films
PaperThe interaction of Sb4 molecular beams with Si(100) surfaces: Modulated-beam mass spectrometry and thermally stimulated desorption studies
- S.A. Barnett
- Harold F. Winters
- et al.
- 1986
- Surface Science
PaperThermal dry process soldering
- S.K. Ray
- H.L. Yeh
- 1986
- JVSTA
PaperCalorimetry in thin film processing
- S. Shivashankar
- B. Robinson
- 1986
- JVSTA
PaperProperties of Cr-N films produced by reactive sputtering
- K.K. Shih
- D.B. Dove
- et al.
- 1986
- JVSTA
PaperLow temperature material reaction at the Ti/Si(111) interface
- R.M. Tromp
- G.W. Rubloff
- et al.
- 1986
- JVSTA
Paper