Josephson Edge-Junction Devices Using E-Beam Lithography
- Peter Vettiger
- David F. Moore
- et al.
- 1981
- IEEE T-ED
Paper
Publications
465 results at IEEE T-ED
Resolution, Overlay, and Field Size for Lithography Systems
- Alec N. Broers
- 1981
- IEEE T-ED
PaperDeep UV Photoresists I. Meldrum's Diazo Sensitizer
- Barbara D. Grant
- Nicholas J. Clecak
- et al.
- 1981
- IEEE T-ED
PaperDevice Characterization of an Electron-Beam-Switched Thin-Film ZnS:Mn Electroluminescent Faceplate
- Omesh Sahni
- Paul M. Alt
- et al.
- 1981
- IEEE T-ED
PaperResolution and Linewidth Tolerances in Electron Beam and Optical Projection Lithography
- Tung Symon Chang
- David F. Kyser
- et al.
- 1981
- IEEE T-ED
PaperDual-Electron-Injector-Structure Electrically Alterable Read-Only-Memory Modeling Studies
- D.J. Dimaria
- David W. Dong
- et al.
- 1981
- IEEE T-ED
PaperSelf-Aligned Bipolar Transistors for High-Performance and Low-Power-Delay VLSI
- Tak H. Ning
- Randall D. Isaac
- et al.
- 1981
- IEEE T-ED
PaperRD3D 〈Computer Simulation of Resist Development in Three Dimensions〉
- Fletcher Jones
- Jurij Paraszczak
- 1981
- IEEE T-ED
PaperEvaluation of Light Sources for TDI Polysilicon Electrode CCD Document Scanners
- A.J. Schell-Sorokin
- G.W. Lynch
- 1981
- IEEE T-ED
PaperA Study of the Conversion Efficiency Limit of p+-i-n+ Silicon Solar Cells in Concentrated Sunlight
- Terry I. Chappell
- 1980
- IEEE T-ED
Paper