A comparative study of SIMS depth profiling of boron in silicon
- J.B. Clegg
- A.E. Morgan
- et al.
- 2004
- Surface and Interface Analysis
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Publications
14462 results for Physical Sciences
Electric‐field‐induced room‐temperature doping in CuInSe2
- Abram Jakubowicz
- Geula Dagan
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- 2004
- Advanced Materials
PaperQuantitative time‐of‐flight secondary ion mass spectrometry of a perfluorinated polyether
- David E. Fowler
- Roboert D. Johnson
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- 2004
- Surface and Interface Analysis
PaperInfluence of the bombarding ion energy and surface composition on the ground‐state atom fraction in solids analysis using multiphoton resonance ionization
- David L. Pappas
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- 2004
- Surface and Interface Analysis
PaperUltrafast electron dynamics at semiconductor surfaces and interfaces studied with subpicosecond laser photoemission
- R. Haight
- M. Baeumler
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- 2004
- Surface and Interface Analysis
PaperA possible solution to the problem of compositional change with ion‐bombarded oxides
- Imre Bertóti
- Roger Kelly
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- 2004
- Surface and Interface Analysis
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- O. Albrektsen
- H. Salemink
- 2004
- Surface and Interface Analysis
PaperVoltage contrast XPS—a novel scheme for spatially resolved XPS studies
- John J. Boland
- 2004
- Surface and Interface Analysis
PaperChromium chromate as an inert marker in copper oxidation
- Robert J. Day
- Margaret A. Frisch
- 2004
- Surface and Interface Analysis
PaperStudy of near‐surface disorder and surface residues after reactive Ion etching of Silicon
- G.S. Oehrlein
- G.J. Coyle
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- 2004
- Surface and Interface Analysis
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