Growth of silicon oxide in thin film block copolymer scaffolds
- Dong Ha Kim
- Xinqiao Jia
- et al.
- 2004
- Advanced Materials
Paper
Publications
14462 results for Physical Sciences
Reliability of MOS devices with tungsten gates
- F. Palumbo
- S. Lombardo
- et al.
- 2004
- Microelectronic Engineering
PaperEffects of radiation and charge trapping on the reliability of high- κ gate dielectrics
- J.A. Felix
- J.R. Schwank
- et al.
- 2004
- Microelectronics Reliability
PaperCharge trapping in SiO2/HfO2 gate dielectrics: Comparison between charge-pumping and pulsed ID-VG
- A. Kerber
- E. Cartier
- et al.
- 2003
- INFOS 2003
Conference paperInterface trapping properties of nMOSFETs with Al2O 3/SiOxNy/Si(1 0 0) gate dielectric stacks after exposure to ionizing radiation
- J.A. Felix
- H.D. Xiong
- et al.
- 2003
- INFOS 2003
Conference paperCharge trapping and detrapping in HfO2 high-κ gate stacks
- E. Gusev
- C. D'Emic
- et al.
- 2003
- INFOS 2003
Conference paperEffect and model of gate oxide breakdown on CMOS inverters
- R. Rodríguez
- J.H. Stathis
- et al.
- 2003
- INFOS 2003
Conference paperInterfacial defects and lamellar decomposition in titanium aluminides
- M. Aindow
- T.T. Cheng
- et al.
- 2004
- Interface Science
Conference paperStatistics of progressive breakdown in ultra-thin oxides
- B.P. Linder
- J.H. Stathis
- 2003
- INFOS 2003
Conference paperAmbipolar-to-unipolar conversion of carbon nanotube transistors by gate structure engineering
- Yu-Ming Lin
- Joerg Appenzeller
- et al.
- 2004
- Nano Letters
Paper