Dislocation dynamics simulations of dislocation interactions in thin FCC metal films
- Prita Pant
- K.W. Schwarz
- et al.
- 2001
- Materials Research Society Symposium - Proceedings
Paper
Publications
14462 results for Physical Sciences
Exploring thin-film reactions by means of simultaneous x-ray surface roughness and resistance measurements
- C. Lavoie
- C. Cabral Jr.
- et al.
- 2001
- Defect and Diffusion Forum
PaperUltrathin high-K gate stacks for advanced CMOS devices
- E. Gusev
- D.A. Buchanan
- et al.
- 2001
- Technical Digest - International Electron Devices Meeting
PaperOpportunities and challenges in ultra low k dielectrics for interconnect applications
- S. Purushothaman
- S.V. Nitta
- et al.
- 2001
- Technical Digest-International Electron Devices Meeting
PaperPorous silica materials as low-k dielectrics for electronic and optical interconnects
- A. Jain
- S. Rogojevic
- et al.
- 2001
- Thin Solid Films
PaperTexture in Ti/Al and Nb/Al multilayer thin films: Role of Cu
- G.A. Lucadamo
- Katayun Barmak
- et al.
- 2001
- Journal of Materials Research
PaperIn situ and ex situ measurements of stress evolution in the cobalt-silicon system
- G.A. Lucadamo
- C. Lavoie
- et al.
- 2001
- Materials Research Society Symposium - Proceedings
PaperHigh coercivity of ultra-high-density ordered Co nanorod arrays
- T. Shibauchi
- L. Krusin-Elbaum
- et al.
- 2001
- Journal of Magnetism and Magnetic Materials
PaperLayout and language: An efficient algorithm for detecting text blocks based on spatial and linguistic evidence
- Matthew Hurst
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
PaperBurstein-Moss shift of n-doped In0.53Ga0.47As/inp
- Martín Muñoz
- Fred H. Pollak
- et al.
- 2001
- Physical Review B - CMMP
Paper