Pion-induced soft upsets in 16 Mbit DRAM chips
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Interface Defect Formation in MOSFETs by Atomic Hydrogen Exposure
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PaperIon Microbeam Radiation System
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PaperAvalanche injection of holes into SiO2
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PaperElectron injection studies of radiation induced positive charge in MOS devices
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PaperA time shared system for multiple independent laboratories
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PaperOn the merits of interface standardization: A round table discussion
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