Reversal of Relative Oxidation Rates of <111> and <100> Oriented Silicon Substrates at Low Oxygen Partial Pressures
- S.I. Raider
- L.E. Forget
- et al.
- 2019
- JES
Paper
Publications
509 results at JES
Silicon Oxidation Studies: Measurement of the Diffusion of Oxidant in SiO2 Films
- E.A. Irene
- 2019
- JES
PaperSolar Cells on Large-Grain GaAs Thin Films
- S.M. Vernon
- A.E. Blakeslee
- et al.
- 2019
- JES
PaperPreparation and Electrical Properties of V2O3 Single Crystals of Controlled Stoichiometry
- S.A. Shivashankar
- R. Aragón
- et al.
- 2019
- JES
PaperA Viscous Flow Model to Explain the Appearance of High Density Thermal Si02 at Low Oxidation Temperatures
- E. Tierney
- J. Angilello
- 2019
- JES
PaperOn the Nature of CVD Si-Rich SiO2 and Si3N4 Films
- E.A. Irene
- N.J. Chou
- et al.
- 2019
- JES
PaperThe Anodic Sectioning of Beryllium
- M.T. Shehata
- Roger Kelly
- et al.
- 2019
- JES
PaperTiO2 Antireflection Coatings by a Low Temperature Spray Process
- H.J. Hovel
- 2019
- JES
PaperEffects of Ammonia Anneal on Electron Trappings in Silicon Dioxide
- D.W. Dong
- A. Hartstein
- 2019
- JES
PaperDirect Evidence for 1 nm Pores in “Dry” Thermal SiO2 from High Resolution Transmission Electron Microscopy
- J.M. Gibson
- D.W. Dong
- 2019
- JES
Paper