Copper interconnect: Fabrication and reliability
- C.-K. Hu
- J.M.E. Harper
- 1997
- VLSI-TSA 1997
Conference paper
Publications
14468 results for Physical Sciences
Dual-mode parasitic bipolar effect in dynamic CVSL XOR circuit with floating-body partially-depleted SOI devices
- C.T. Chuang
- P.F. Lu
- et al.
- 1997
- VLSI-TSA 1997
Conference paperComputer chess, then and now: The deep blue saga
- Feng-hsiung Hsu
- 1997
- VLSI-TSA 1997
Conference paperDesign for signal integrity: The new paradigm for deep-submicron VLSI design
- Howard H. Chen
- L.K. Wang
- 1997
- VLSI-TSA 1997
Conference paperThe impact of device scaling limits
- Lewis M. Terman
- 1997
- Applied Surface Science
PaperCrystalline structure and orientation of gold clusters grown in preformed nanometer-sized pits
- H. Hövel
- T. Becker
- et al.
- 1997
- Applied Surface Science
PaperField-induced staggered magnetization near impurities in the S= one-dimensional Heisenberg antiferromagne
- Masashi Takigawa
- Naoki Motoyama
- et al.
- 1997
- Physical Review B - CMMP
PaperFinite vortex correlation in the c direction above the first-order melting transition
- E. Righi
- S. Grigera
- et al.
- 1997
- Physical Review B - CMMP
PaperCu adsorption on Co films: Edge decoration versus intermixing
- R. Allenspach
- A. Bischof
- et al.
- 1997
- Surface Science
PaperHybrid FEM - BEM method for fast micromagnetic calculations
- T.R. Koehler
- 1997
- Physica B: Condensed Matter
Paper