Effects of texture, microstructure, and alloy content on electromigration of aluminum-based metallization
- D.B. Knorr
- K.P. Rodbell
- 1992
- SPIE Microelectronic Processing 1992
Conference paper
Publications
14462 results for Physical Sciences
Performance consideration for the scaling of sub-micron on-chip interconnections
- Yuh-Jier Mii
- 1992
- SPIE Microelectronic Processing 1992
Conference paperElectromigration and stress reliability in multilevel interconnect metallization
- Paul S. Ho
- M.A. Moske
- et al.
- 1992
- SPIE Microelectronic Processing 1992
Conference paperThe adsorption structure of 2,5-dihydrothiophene on Mo(110)-(4 × 1)-S: ring orientation as determined by NEXAFS
- Han Xu
- Per Uvdal
- et al.
- 1993
- Surface Science
PaperExperimental determination of the unoccupied bands of W(110)
- Dongqi Li
- P.A. Dowben
- et al.
- 1993
- Physical Review B
PaperOscillatory Landé factor of two-dimensional electrons under high magnetic fields
- E. Mendez
- J.J. Nocera
- et al.
- 1993
- Physical Review B
PaperCyclotron trapping, mode spectroscopy, and mass enhancement in small GaAs/AlxGa1-xAs rings
- J. Liu
- K. Ismail
- et al.
- 1993
- Physical Review B
PaperDetermination of conduction-band states in GaAs(110), InP(110), and InAs(110)
- Jürgen Faul
- Georg Neuhold
- et al.
- 1993
- Physical Review B
PaperFrequency dependence of dielectric loss in thin aromatic polyimide films
- M.O. Aboelfotoh
- C. Feger
- 1993
- Physical Review B
PaperMultilayer high-temperature superconductors
- N. Lazarides
- T. Schneider
- et al.
- 1993
- Physica C: Superconductivity and its applications
Paper