Electrochemical Test to Evaluate Passivation Layers: Overcoats of Si in Ink
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- J.M. Eldridge
- et al.
- 2019
- JES
Paper
Publications
14465 results for Physical Sciences
Al Coverage of Surface Steps at SiO2 Insulated Polycrystalline Si Boundaries: Al Evaporation in Vacuum and Low Pressure Ar
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- V.L. Rideout
- et al.
- 2019
- JES
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- A. Ray
- A. Reisman
- 2019
- JES
PaperInvestigation of Energy Traps and Phosphorescence in Zinc Silicate Phosphors by Photostimulated Emission
- I.F. Chang
- G.A. Sai-Halasz
- 2019
- JES
PaperSilicon Oxidation Studies: Some Aspects of the Initial Oxidation Regime
- E.A. Irene
- 2019
- JES
PaperThe Defect Structure of Pure and Doped ZnSe
- A. Ray
- F.A. Kröger
- 2019
- JES
PaperEffect of Plating Parameters on Electrodeposition of NiFe
- J. Horkans
- 2019
- JES
PaperControl of Plasma Etch Profiles with Plasma Sheath Electric Field and RF Power Density
- R.S. Horwath
- 2019
- JES
PaperReactive Ion Etching of PECVD n+ a-Si:H: Plasma Damage to PECVD Silicon Nitride Film and Application to Thin Film Transistor Preparation
- M.S. Crowder
- 2019
- JES
PaperLow Energy Proton Beam Lithography with a Thin Oxygen-Etch Barrier Layer
- H. Hiraoka
- 2019
- JES
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