Direct observation of anelastic bond-orientational anisotropy in amorphous Tb26Fe62Co12 thin films by x-ray diffraction
- X. Yan
- M. Hirscher
- et al.
- 1991
- Physical Review B
Paper
Publications
14466 results for Physical Sciences
Stress-induced layer-by-layer growth of Ge on Si(100)
- 1991
- Physical Review B
PaperNew High-Resolution and High-Sensitivity Deep UV, X-Ray, and Electron-Beam Resists
- M. Hatzakis
- K.J. Stewart
- et al.
- 1991
- JES
PaperComparison between Si(100) and Si(111) in the reaction with oxygen at high temperatures
- Ulrich Memmert
- Yu Ming L
- 1991
- Surface Science
PaperStructure and magnetization of (100) FeCr and FeV films deposited on Pd/Cu/Si(100)
- Chin-An Chang
- 1991
- Journal of Magnetism and Magnetic Materials
PaperSoft x-ray diffraction studies on polymeric Langmuir-Blodgett films
- W. Jark
- T.P. Russell
- et al.
- 1991
- Thin Solid Films
PaperScanning tunneling microscopy and spectroscopy of Bi-Sr-Ca-Cu-O 2:2:1:2 high-temperature superconductors
- C.K. Shih
- R.M. Feenstra
- et al.
- 1991
- Physical Review B
PaperInfrared reflectivity study of phase transitions in kH2PO4-type compounds
- E. Courtens
- F. Gervais
- 1991
- Phase Transitions
PaperCompositional changes during magnetron sputtering of alloys
- S.M. Rossnagel
- I. Yang
- et al.
- 1991
- Thin Solid Films
PaperElasticity and the Landau-Peierls instability in the smectic twist-grain-boundary phase
- John Toner
- 1991
- Physical Review B
Paper