Thermal stability of polycrystalline silicon/metal oxide interfaces
- A.C. Callegari
- E. Gousev
- et al.
- 2002
- Applied Physics Letters
Paper
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2351 results at Applied Physics Letters
Characterization of silicate/Si(001) interfaces
- M. Copel
- E. Cartier
- et al.
- 2002
- Applied Physics Letters
PaperInterfacial oxide formation and oxygen diffusion in rare earth oxide-silicon epitaxial heterostructures
- V. Narayanan
- S. Guha
- et al.
- 2002
- Applied Physics Letters
PaperA form of bulk silicon consisting of "magic" clusters
- M. Grass
- D. Fischer
- et al.
- 2002
- Applied Physics Letters
PaperHigh temperature stability of Al2O3 dielectrics on Si: Interfacial metal diffusion and mobility degradation
- S. Guha
- E. Gusev
- et al.
- 2002
- Applied Physics Letters
PaperImpact of the channel thickness on the performance of Schottky barrier metal-oxide-semiconductor field-effect transistors
- J. Knoch
- J. Appenzeller
- 2002
- Applied Physics Letters
PaperComposition of self-assembled Ge/Si islands in single and multiple layers
- O.G. Schmidt
- U. Denker
- et al.
- 2002
- Applied Physics Letters
PaperSignal decay and amplitude measurements of antiferromagnetically coupled magnetic recording media
- Andreas Moser
- David T. Margulies
- et al.
- 2002
- Applied Physics Letters
PaperRecording performance of high-density patterned perpendicular magnetic media
- M. Albrecht
- C.T. Rettner
- et al.
- 2002
- Applied Physics Letters
PaperImpact of moisture on charge trapping and flatband voltage in Al 2O3 gate dielectric films
- Sufi Zafar
- A.C. Callegari
- et al.
- 2002
- Applied Physics Letters
Paper