Lateral dopant profiling on a 100 nm scale by scanning capacitance microscopy
- C.C. Williams
- J. Slinkman
- et al.
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Publications
14467 results for Physical Sciences
Effect of atomic size on the minimum X-ray absorption coefficient in the six-beam Borrmann diffraction
- R.E. Feldman
- T.C. Huang
- 1990
- Solid State Communications
PaperKinetics of physical adsorption of ethane on lr(110)-(1 × 2): Molecular beam reflectivity measurements and Monte Carlo simulations
- W.H. Weinberg
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperOxygen mobility in YBa2Cu3O7-δ: A Raman study
- Gerald Burns
- F.H. Dacol
- et al.
- 1990
- Solid State Communications
PaperAn ionic model of the crystal chemistry in the superconducting copper oxides of stoichiometry (RE)2CuO4
- Joseph F. Bringley
- Steven S. Trail
- et al.
- 1990
- Journal of Solid State Chemistry
PaperX-ray photoelectron spectroscopy and ellipsometry studies of the electrochemically controlled adsorption of benzotriazole on copper surfaces
- S.L. Cohen
- V. Brusic
- et al.
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperGallium arsenide optoelectronic IC's for computer networks
- M.H. Brodsky
- 1990
- Superlattices and Microstructures
PaperAdhesion studies of metals on fluorocarbon polymer films
- Chin-An Chang
- Yong-Kil Kim
- et al.
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperMolecular beam studies of trapping dynamics
- W.H. Weinberg
- C.B. Mullins
- et al.
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperThe Si(001)/SiO2 interface
- A. Ourmazd
- P.H. Fuoss
- et al.
- 1990
- Applied Surface Science
Paper