Structural Evolution of Cylindrical-Phase Diblock Copolymer Thin Films
- C.T. Black
- K.W. Guarini
- 2004
- J Polym Sci Part A
Paper
Publications
24864 results for Exploratory Science
Effect of thin-film imaging on line edge roughness transfer to underlayers during etch processes
- Dario L. Goldfarb
- Arpan P. Mahorowala
- et al.
- 2004
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperJahn-Teller transition in TiF3 investigated using density-functional theory
- Vasili Perebeinos
- Tom Vogt
- 2004
- Physical Review B - CMMP
PaperA tunnelling formalism
- Peter J. Price
- 2004
- Semiconductor Science and Technology
Conference paperFlavours of intrinsic d-wave induced effects in YBa2Cu 3O7-δ grain boundary Josephson junctions
- F. Tafuri
- J.R. Kirtley
- et al.
- 2004
- Supercond Sci Technol
Conference paperThe nucleation of pentacene thin films
- F.-J. Meyer Zu Heringdorf
- M.C. Reuter
- et al.
- 2004
- Applied Physics A: Materials Science and Processing
PaperWALRUS: A similarity retrieval algorithm for image databases
- Apostol Natsev
- Rajeev Rastogi
- et al.
- 2004
- IEEE Transactions on Knowledge and Data Engineering
PaperSelf-tuning of the relationships among rules' components in active databases systems
- David Botzer
- Opher Etzion
- 2004
- IEEE Transactions on Knowledge and Data Engineering
PaperText categorization for a comprehensive time-dependent benchmark
- Fred J. Damerau
- Tong Zhang
- et al.
- 2004
- Inf. Process. Manage.
PaperStrain effects in thin film/Si substrates revealed by X-ray microdiffraction
- C.E. Murray
- I.C. Noyan
- et al.
- 2004
- Powder Diffraction
Paper