Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
Selective protection of the porosity can be implemented in porous materials processing by using an organic polymer fill. This strategy is employed to protect ultralow-k (ULK) materials during patterning of 250-nm lines and spaces. Structures with significantly less sidewall and trench bottom damage are obtained, proving the potential of this novel approach in materials science. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011
Sung Ho Kim, Oun-Ho Park, et al.
Small
Shiyi Chen, Daniel Martínez, et al.
Physics of Fluids