Conference paper
Gate stack resistance and limits to CMOS logic performance
Richard A. Wachnik, S. Lee, et al.
CICC 2013
We present a schematic transistor model for multifinger multifin FETs, which greatly simplifies an initially complex network. The schematic finFET model accepts various finFET layout information and is accurate in predicting the overall finFET characteristics, including the effect of parasitic resistance (R) and capacitance (C) in a finFET. © 1980-2012 IEEE.
Richard A. Wachnik, S. Lee, et al.
CICC 2013
R. Singh, K. Aditya, et al.
IEEE Electron Device Letters
Yoo-Mi Lee, Myung-Hee Na, et al.
IEDM 2017
Scott K. Springer, Sungjae Lee, et al.
IEEE Transactions on Electron Devices