Conference paper
Low-noise SiGe pMODFETs on sapphire with 116 GHz fmax
S.J. Koester, R. Hammond, et al.
DRC 2000
In this letter, we present results of enhancement and depletion mode transistors fabricated on the same layer structure of Si/SiGe, without using gate recess. The current in the enhancement mode device is controlled by a pn-junction, while that of the depletion-mode device is controlled by a Schottky barrier. A peak transconductance of 327 mS/mm and 417 mS/mm has been achieved in 0.5-μm gate length depletion and enhancement-mode transistors, respectively.
S.J. Koester, R. Hammond, et al.
DRC 2000
K. Ismail, T.P. Smith III, et al.
Applied Physics Letters
S.J. Koester, K. Ismail, et al.
Physical Review B - CMMP
S.J. Koester, K. Ismail, et al.
Applied Physics Letters