VLSI on-chip interconnection performance simulations and measurements
- D. Edelstein
- G.A. Sai-Halasz
- et al.
- 1995
- IBM J. Res. Dev
Paper
Publications
147 results for Daniel Edelstein
High performance dielectrics and processes for ULSI interconnection technologies
- J. Paraszczak
- D. Edelstein
- et al.
- 1993
- IEDM 1993
Conference paperElectrical and physical properties of high-Ge-content Si/SiGe p-type quantum wells
- R.A. Kiehl
- P.E. Batson
- et al.
- 1993
- Physical Review B
PaperOptical measurement of internal logic patterns in a flip-chip mounted silicon SRAM integrated circuit
- H. Heinrich
- N. Pakdaman
- et al.
- 1992
- LEOS 1992
Conference paperMicrowave properties of free-standing dielectric films
- W. Robertson
- G. Arjavalingam
- et al.
- 1992
- Electronics Letters
PaperRapid programmable 300 ps optical delay scanner and signal-averaging system for ultrafast measurements
- D. Edelstein
- R.B. Romney
- et al.
- 1991
- Review of Scientific Instruments
Paper3-D capacitance modeling of advanced multilayer interconnection technologies
- Daniel C. Edelstein
- 1990
- SPIE Advances in Intelligent Robotics Systems 1990
Conference paper