An efficient and accurate schematic transistor model of FinFET parasitic elements
- Ning Lu
- Terence B. Hook
- et al.
- 2013
- NSTI-Nanotech 2013
Conference paper
Publications
32 results for Jeffrey B. Johnson
Ab initio study of metal grain orientation-dependent work function and its impact on FinFET variability
- Samarth Agarwal
- Rajan Kumar Pandey
- et al.
- 2013
- IEEE T-ED
PaperModeling and analysis of transistor mismatch due to variability in short-channel effect induced by random dopant fluctuation
- Nauman Z. Butt
- Jeffrey B. Johnson
- 2012
- IEEE Electron Device Letters
PaperHigh-performance nMOSFET with in-situ phosphorus-doped embedded Si:C (ISPD eSi:C) source-drain stressor
- B. Yang
- R. Takalkar
- et al.
- 2008
- IEDM 2008
Conference paperAnalysis and modeling of threshold voltage mismatch for CMOS at 65 nm and beyond
- Jeffrey B. Johnson
- Terence B. Hook
- et al.
- 2008
- IEEE Electron Device Letters
PaperA simple hardware-based statistical model on 65nm SOI CMOS technology
- Q. Liang
- J.B. Johnson
- et al.
- 2007
- ISDRS 2007
Conference paperP-i-n diodes for monolithic millimetre wave BiCMOS applications
- Bradley A. Orner
- Qizhi Liu
- et al.
- 2006
- Semiconductor Science and Technology
PaperSiGe BiCMOS trends - today and tomorrow
- J. Dunn
- D.L. Harame
- et al.
- 2006
- CICC 2006
Conference paperSilicon CMOS devices beyond scaling
- Wilfried Haensch
- Edward J. Nowak
- et al.
- 2006
- IBM J. Res. Dev
PaperP-i-n diodes for monolithic millimeter wave BiCMOS applications
- Bradley A. Orner
- Qizhi Liu
- et al.
- 2006
- ISTDM 2006
Conference paper