An irradiation effect in thermally grown SiO2
- Oliver C. Wells
- 2003
- Applied Physics Letters
Paper
Publications
52 results for O.C. Wells
Method for examining solid specimens with improved resolution in the scanning electron microscope (SEM)
- O.C. Wells
- A.N. Broers
- et al.
- 2003
- Applied Physics Letters
PaperDiscussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)
- Oliver C. Wells
- 2002
- Microscopy and Microanalysis
PaperVoltage measurement in the scanning electron microscope
- O.C. Wells
- C.G. Bremer
- 2002
- Journal of Physics E: Scientific Instruments
PaperImproved energy analyser for the scanning electron microscope
- O.C. Wells
- C.G. Bremer
- 2002
- Journal of Physics E: Scientific Instruments
PaperApplication of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samples
- Oliver C. Wells
- Maurice McGlashan-Powell
- et al.
- 2001
- Scanning
PaperStudies of samples having shallow surface topography by the low-loss electron (LLE) method in the scanning electron microscope (SEM)
- O.C. Wells
- Maurice McGlashen-Powell
- et al.
- 2000
- Scanning
PaperComparison of different models for the generation of electron backscattering patterns in the scanning electron microscope
- Oliver C. Wells
- 1999
- Scanning
PaperExamining deep holes by rocking the beam in the scanning electron microscope
- Oliver C. Wells
- 1996
- Review of Scientific Instruments
PaperStudies of poorly conducting samples by the low-loss electron method in the scanning electron microscope
- O.C. Wells
- S. Rishton
- 1994
- MSA Annual Meeting 1994
Conference paper