300 mm wafer fabrication line simulation model
- Sameer T. Shikalgar
- David Fronckowiak
- et al.
- 2002
- WSC 2002
Conference paper
Publications
24864 results for Exploratory Science
High mobility p-channel germanium MOSFETS with a thin Ge oxynitride gate dielectric
- Huiling Shang
- Harald Okorn-Schmidt
- et al.
- 2002
- IEDM 2002
Conference paperAn example of how an unconventional order parameter symmetry may open new perspectives in the design of HTS Josephson junctions
- F. Tafuri
- F. Lombardi
- et al.
- 2002
- SPIE Optical Science and Technology 2002
Conference paperCharge trapping in high K gate dielectric stacks
- Sufi Zafar
- Alessandro Callegari
- et al.
- 2002
- IEDM 2002
Conference paperIon projection direct-structuring for nanotechnology applications
- Hans Loeschner
- Ernest J. Fantner
- et al.
- 2002
- MRS Proceedings 2002
Conference paperMetal-gate FinFET and fully-depleted SOI devices using total gate silicidation
- Jakub Kedzierski
- Edward Nowak
- et al.
- 2002
- IEDM 2002
Conference paperBallistic FET modeling using QDAME: Quantum device analysis by modal evaluation
- Steven E. Laux
- Arvind Kumar
- et al.
- 2002
- IEEE TNANO
Conference paperSearching with numbers
- Rakesh Agrawal
- Ramakrishnan Srikant
- 2002
- WWW 2002
Conference paperTemplate detection via data mining and its applications
- Ziv Bar-Yossef
- Sridhar Rajagopalan
- 2002
- WWW 2002
Conference paperPanel session: Opportunities for simulation in supply chain management
- Jerry Banks
- Steve Buckley
- et al.
- 2002
- WSC 2002
Conference paper