Reactive sputtering of copper and silicon near the sputtering thresholdT.M. MayerJ.M.E. Harperet al.1985JVSTAPaper
Summary Abstract: The interaction mechanism of inelastic electron tunneling spectroscopy probed by high resolution electron energy loss spectroscopyM. LiehrP.A. Thiryet al.1985JVSTAPaper
Properties and Microelectronic Applications of Thin Films of Refractory Metal NitridesMarc Wittmer1985JVSTAPaper
Summary Abstract: Investigation of the interface chemistry of titanium-tungsten Schottky barrier contacts to silicon by Auger spectroscopyJ.E. LewisM.O. Aboelfotohet al.1985JVSTAPaper
Electron-gun Evaporators of Refractory Metals Compatible with Molecular Beam EpitaxyM. HeiblumJ. Blochet al.1985JVSTAPaper
Probing Valence States with Photoemission and Inverse PhotoemissionF.J. HimpselTh. Fauster1984JVSTAPaper