VA-6 Investigation of Stress Effects on the DC Characteristics of GaAs MESFET's Through the Use of Externally Applied Loads
- T.N. Jackson
- Jean-Claude Ramirez
- et al.
- 1987
- IEEE T-ED
Paper
Publications
465 results at IEEE T-ED
On the Resistivity of TiSi2: The Implication for Low-Temperature Applications
- Lia Krusin-Elbaum
- Jack Yuan-Chen Sun
- et al.
- 1987
- IEEE T-ED
PaperIn Situ Arsenic-Doped Polysilicon for VLSI Applications
- Maurizio Arienzo
- Andrew C. Megdanis
- et al.
- 1986
- IEEE T-ED
PaperIntegrated Electron Sources for Multibeam CRT's
- Bruce P. Piggin
- Eugenio Segredo
- et al.
- 1986
- IEEE T-ED
PaperFirst- and Second-Order Freedericksz Transitions in Nematic Liquid Crystals Subjected to Static and Optical-Electromagnetic Fields
- Hiap Liew Ong
- 1986
- IEEE T-ED
PaperPhysics, Technology, and Modeling of Polysilicon Emitter Contacts for VLSI Bipolar Transistors
- Gary L. Patton
- James D. Plummer
- 1986
- IEEE T-ED
PaperIIIA-2 Simulation and Analysis of Recombination and Grading Effects in GaAlAs/GaAs HBT's
- Sandip Tiwari
- David J. Frank
- 1986
- IEEE T-ED
PaperOn the Accuracy of Channel Length Characterization of LDD MOSFET's
- Jack Y.-C. Sun
- Matthew R. Wordeman
- et al.
- 1986
- IEEE T-ED
PaperHigh-Mobility FET in Strained Silicon
- Robert W. Keyes
- 1986
- IEEE T-ED
PaperPERPENDICULAR TRANSPORT MEASUREMENTS IN GaAs/(Al,Ga)As/GaAs HETEROSTRUCTURES.
- P. Solomon
- S.L. Wright
- 1986
- IEEE T-ED
Paper