Electromigration in gold and copper thin film conductorsR.J. MillerA. Gangulee1980Thin Solid FilmsPaper
The effects of oxygen and copper impurities on the structure of amorphous germaniumJ.F. Graczyk1980Thin Solid FilmsPaper
The influence of ion sputtering on the elemental analysis of solid surfacesJ.W. Coburn1979Thin Solid FilmsPaper
Thermal strain in lead thin films IV: Effects of multiple cycling to 4.2 KM. MurakamiJ. Angelilloet al.1979Thin Solid FilmsPaper
Thermal strain in thin lead films III: Dependences of the strain on film thickness and on grain sizeMasanori Murakami1979Thin Solid FilmsPaper
Thermal strain in lead thin films II: strain relaxation mechanismsMasanori Murakami1978Thin Solid FilmsPaper
A thin film metal base transistor structure with amorphous siliconA. DeneuvilleM.H. Brodsky1978Thin Solid FilmsPaper