Eigenvalues and partitionings of the edges of a graphA.J. Hoffman1972Linear Algebra and Its Applications
Stable growth rates and temperature programming in flux growthH.J. ScheelD. Elwell1972Journal of Crystal Growth
Contact resistances of AuGeNi, AuZn and Al to III-V compoundsK.K. ShihJ.M. Blum1972Solid-State Electronics
IOTA, a new computer controlled thin film thickness measurement toolK. KonnerthF.H. Dill1972Solid-State Electronics
Fracture of brittle epitaxial films under the influence of misfit stressJ.W. MatthewsE. Klokholm1972Materials Research Bulletin
GaAs1-xPx Electroluminescent Diodes Made by Zn Diffusion in an Open-Tube SystemK.K. ShihJ.M. Blum1972JES
Anomalous large grains in alloyed aluminum thin films I. Secondary grain growth in aluminum-copper filmsA. GanguleeF.M. D'Heurle1972Thin Solid Films