Electronic states and microstructure at the silicide-silicon interface
- P.S. Ho
- G.W. Rubloff
- 1982
- Thin Solid Films
Paper
Publications
3553 results for Materials Discovery
Strain relaxation mechanisms of lead and lead alloy thin films on silicon substrates
- Masanori Murakami
- Tung-Sheng Kuan
- et al.
- 1982
- Thin Solid Films
PaperA computer calculation of step coverage in SiO thin films
- G.R. Proto
- I.A. Blech
- et al.
- 1982
- Thin Solid Films
PaperThe electronic structure of impurities and defects in SiO2
- Sokrates T. Pantelides
- 1982
- Thin Solid Films
PaperAdsorbate band dispersions for C on Ru(0001)
- F.J. Himpsel
- K. Christmann
- et al.
- 1982
- Surface Science
PaperR.F. Sputtering of LiNbO3 thin films
- G.H. Hewig
- K. Jain
- et al.
- 1982
- Thin Solid Films
PaperAn iterative method for calculating hard-wall diffraction intensities
- Robert H. Swendsen
- K.H. Rieder
- 1982
- Surface Science
PaperMeasurement of the subband widths in semimetallic InAs-GaSb superlattices
- J.C. Maan
- Y. Guldner
- et al.
- 1982
- Surface Science
PaperSingle intermetallic compound formation in Pd-Pb and Pd-Sn thin-film couples studied by X-ray diffraction
- K.N. Tu
- 1982
- Materials Letters
PaperTwo-dimensional quantum states in multi-heterostructures of three constituents
- E. Mendez
- L.L. Chang
- et al.
- 1982
- Surface Science
Paper