Reliability of ultra-thin oxides in CMOS circuits
- J.H. Stathis
- B.P. Linder
- et al.
- 2003
- Microelectronics Reliability
Conference paper
Publications
14462 results for Physical Sciences
Ultrathin HfO2 films grown on silicon by atomic layer deposition for advanced gate dielectrics applications
- E. Gusev
- C. Cabral Jr.
- et al.
- 2003
- Microelectronic Engineering
Conference paperFMR studies of CrO2 epitaxial thin films
- B.Z. Rameev
- R. Yilgin
- et al.
- 2003
- Microelectronic Engineering
Conference paperInfluence and model of gate oxide breakdown on CMOS inverters
- R. Rodríguez
- J.H. Stathis
- et al.
- 2003
- Microelectronics Reliability
Conference paperLatchup Analysis Using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- Microelectronics Reliability
Conference paperThickness-dependent changes in the optical properties of PPV- and PF-based polymer light emitting diodes
- M. Leger
- S.A. Carter
- et al.
- 2003
- Physical Review B - CMMP
PaperTemperature and concentration dependence of optical dephasing, spectral-hole lifetime, and anisotropic absorption in Eu3+:Y2SiO5
- Flurin Könz
- Y. Sun
- et al.
- 2003
- Physical Review B - CMMP
PaperFerroelectric field effect device
- A.G. Schrott
- J. Misewich
- et al.
- 2002
- MRS Proceedings 2002
Conference paperEpitaxial Si films grown on lattice matched (LaxY 1-x)O3/Si (111) structures by molecular beam epitaxy
- V. Narayanan
- S. Guha
- et al.
- 2002
- MRS Proceedings 2002
Conference paperReal-time multi-pass MPEG video coding for video-on-demand over ADSL
- Ligang Lu
- 2003
- IS&T/SPIE Electronic Imaging 2003
Conference paper