XPS analysis of fluorinated polyimides
- L.P. Buchwalter
- 1996
- Journal of Adhesion Science and Technology
Paper
Publications
14468 results for Physical Sciences
Electron transport in the quantum hall regime in strained si/sige
- K. Ismail
- 1996
- Physica B: Condensed Matter
PaperNondestructive analysis of structural defects in wide bandgap II-VI heterostructures
- M.S. Goorsky
- S.E. Lindo
- et al.
- 1996
- Journal of Electronic Materials
PaperElectromigration drift velocity in Al-alloy and Cu-alloy lines
- C.-K. Hu
- K.Y. Lee
- et al.
- 1996
- JES
PaperScaling silicon MOS devices to their limits
- S.J. Wind
- D.J. Frank
- et al.
- 1996
- Microelectronic Engineering
PaperThe electrostatic moving objective lens and optimized deflection systems for microcolumns
- M.G.R. Thomson
- 1996
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperNanolithography with an atomic force microscope
- M. Wendel
- B. Irmer
- et al.
- 1996
- Superlattices and Microstructures
PaperHigh resolution electron beam lithography using ZEP-520 and KRS resists at low voltage
- D.M. Tanenbaum
- C.W. Lo
- et al.
- 1996
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperOptical characterization of surfaces during epitaxial growth using RDS and GIXS
- I. Kamiya
- L. Mantese
- et al.
- 1996
- Journal of Crystal Growth
PaperPrecisions on reaction monitoring from in-situ resistance measurements: Relations between such measurements and actual reaction kinetics
- S.-L. Zhang
- F.M. D'Heurle
- 1996
- Thin Solid Films
Paper