Publications

6 results at IRPS 2026

Channel Material and Inner Spacer Impact on Gate Stack TDDB of Gate-All-Around Nanosheet Transistors
- - Huimei Zhou
  - Shogo Mochizuki
  - et al.
- 2026
- IRPS 2026
Conference paper
A Study of MIMcap TDDB Reliability Scaling
- - Baozhen Li
  - Yueming Xu
  - et al.
- 2026
- IRPS 2026
Conference paper
Investigation into Temperature Dependent 2T-nC FeRAM Readout Operation
- - Siyuan Li
  - Jiahui Duan
  - et al.
- 2026
- IRPS 2026
Paper
Reliability Challenges of Emerging Transistor Materials and Architectures Beyond Traditional Scaling
- - Hitoshi Wakabayashi
  - Miaomiao Wang
- 2026
- IRPS 2026
Workshop
Fundamentals of Interconnect Reliability: Physics, Failure Mechanisms, and Qualification
- - Huai Huang
- 2026
- IRPS 2026
Tutorial
Application of SRAM HTOL in Process Qualification and Improvement
- - Yuncheng Song
- 2026
- IRPS 2026
Tutorial