S.K. Wiedmann, Tze Chiang Chen, et al.
IEEE Electron Device Letters
This paper describes advanced Integrated-Schottky-Logic (ISL) circuits featuring double-poly self-alignment, “free” epi-base lateral p-n-p clamp, Selfaligned guard ring Schottky barrier diode, and silicon-filled trench isolation. Using a 0.7-µm-thick epitaxial layer and 1.2-µm minimum dimensions, gate delays of 432 ps (fan-out = 1) and 527 ps (fan-out = 3) are obtained at current levels of 183 and 255 µA/gate, respectively, with nonwalled emitter. With walled emitter (two sides), a gate delay of 382 ps is achieved for fan-out of 3 at a current level of 267 μA/gate. © 1986 IEEE
S.K. Wiedmann, Tze Chiang Chen, et al.
IEEE Electron Device Letters
T.C. Chen, J.D. Cressler, et al.
VLSI Technology 1989
C.T. Chuang, G.P. Li, et al.
ECS Meeting 1984
Kenneth Chin, Ching-Te Chuang, et al.
IEEE Journal of Solid-State Circuits